Extremely sharp carbon nanocone probes for atomic force microscopy imaging

Applied Physics Letters

Volumn 88, Issue 15, 2006, Pages

  Chen, I Chen ^a   Chen, Li Han ^a   Ye, Xiang Rong ^a   Daraio, Chiara ^a   Jin, Sungho ^a   Orme, Christine A ^b   Quist, Arjan ^c   Lal, Ratnesh ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOCONE; NANODOT; WAFER-SCALE SYNTHESIS;

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; ELECTRIC FIELDS; ELECTRON BEAM LITHOGRAPHY; NANOTECHNOLOGY; PLASMA ETCHING;

CARBON;

EID: 33646163442     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2193435     Document Type: Article

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