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Volumn 423, Issue 1-2, 2006, Pages 175-179

Influence of solid-state interfacial reactions on the tensile strength of Cu/electroless Ni-P/Sn-3.5Ag solder joint

Author keywords

Electroless nickel; Interfacial reactions; Mechanical reliability; Solder

Indexed keywords

BRITTLENESS; COPPER; DUCTILITY; FRACTURE; HIGH TEMPERATURE OPERATIONS; INTERMETALLICS; NICKEL; PHASE TRANSITIONS; PHOSPHORUS; TENSILE STRENGTH; TERNARY SYSTEMS; TIN ALLOYS;

EID: 33646151148     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2005.12.040     Document Type: Article
Times cited : (22)

References (18)
  • 15
    • 85161786998 scopus 로고    scopus 로고
    • A. Kumar, Z. Chen, S. Mhaisalkar, C. C. Wong, P. S. Teo, V. Kripesh, Thin Solid Films, in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.