X-ray diffraction line broadening under elastic deformation of a polycrystalline sample: An elastic-anisotropy effect

Journal of Applied Physics

Volumn 90, Issue 5, 2001, Pages 2296-2302

  Singh, Anil K ^a   Balasingh, Chellayyan ^a  

^a SURFACE ENGINEERING DIVISION   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040029005     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1388571     Document Type: Article

References (34)

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