Enhanced near-field resolution in midinfrared using metamaterials

Journal of the Optical Society of America B: Optical Physics

Volumn 23, Issue 3, 2006, Pages 468-478

  Korobkin, Dmitriy ^a   Urzhumov, Yaroslav ^a   Shvets, Gennady ^a  

^a University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED IMAGING; OPTICAL RESOLVING POWER; PERMITTIVITY;

METAMATERIALS; NEGATIVE-PERMITTIVITY MATERIAL; SUPERLENSING EFFECT;

OPTICAL MATERIALS;

EID: 33645735072     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.23.000468     Document Type: Article

References (39)

1. V. M. Shalaev, Nonlinear Optics of Random Media: Fractal Composites and Metal-Dielectric Films, Springer Tracts in Modern Physics (Springer, 2000), Vol.158.
2. R. S. Benninnk, Y.-K. Yoon, R. W. Boyd, and J. E. Sipe, "Accessing the optical nonlinearity of metals with metal-dielectric photonic bandgap structures," Opt. Lett. 24, 1416-1418 (1999).
3. A. J. Ward, J. B. Pendry, and W. J. Stewart, "Photonic dispersion surfaces," J. Phys. Condens. Matter 7, 2217-2224 (1995).
4. 2 photonic band gaps," Appl. Phys. Lett. 72, 1676-1678 (1998).
5. L. Zhou, W. Wen, C. T. Chan, and P. Sheng, "Electromagnetic wave tunneling through negative permittivity media with high magnetic fields," Phys. Rev. Lett. 94, 243905 (2005).
6. D. R. Smith, W. J. Padilla, D. C. Vier, S. C. Nemat-Nasser, and S. Schultz, "Composite medium with simultaneously negative permeability and permittivity," Phys. Rev. Lett. 84, 4184-4187 (2000).
7. R. A. Shelby, D. R. Smith, and S. Schultz, "Experimental verification of a negative index of refraction," Science 292, 77-79 (2001).
8. C. G. Parazzoli, R. B. Greegor, K. Li, B. E. C. Koltenbah, and M. Tanielian, "Experimental verification and simulation of negative index of refraction using Snell's Law," Phys. Rev. Lett. 90, 107401 (2003).
9. A. A. Houck, J. B. Brock, and I. L. Chuang, "Experimental observations of a left-handed material that obeys Snell's Law," Phys. Rev. Lett. 90, 137401 (2003).
10. J. B. Pendry, A. J. Holden, W. J. Stewart, and I. Youngs, "Extremely low frequency plasmons in metallic mesostructures," Phys. Rev. Lett. 76, 4773-4776 (1996).
11. J. B. Pendry, A. J. Holden, D. J. Robbins, and W. J. Stewart, "Magnetism from conductors and enhanced nonlinear phenomena," IEEE Trans. Microwave Theory Tech. 47, 2075-2084 (1999).
12. J. B. Pendry, "Negative refraction makes a perfect lens," Phys. Rev. Lett. 85, 3966-3969 (2000).
13. G. Shvets, "Photonic approach to making a material with a negative index of refraction," Phys. Rev. B 67, 035109 (2003).
14. V. A. Podolskiy, A. K. Sarychev, and V. M. Shalaev, "Plasmon modes and negative refraction in metal nanowire composites," Opt. Express 11, 735-745 (2003).
15. G. Shvets and Y. Urzhumov, "Engineering the electromagnetic properties of periodic nanostructures using electrostatic resonances," Phys. Rev. Lett. 93, 243902 (2004).
16. D. O. S. Melville, R. J. Blaikie, and C. R. Wolf, "Submicron imaging with a planar silver lens," Appl. Phys. Lett. 84, 4403-4405 (2004).
17. N. Fang, H. Lee, C. Sun, and X. Zhang, "Sub-diffraction-limited optical imaging with a silver superlens," Science 308, 534-537 (2005).
18. R. W. Waynant, I. K. Ilev, and I. Gannot, "Mid-infrared laser applications in medicine and biology," Philos. Trans. R. Soc. London, Ser. A 359, 635-644 (2001).
19. F. Capasso R. Paiella, R. Martini, R. Colombelli, C. Gmachl, T. L. Myers, M. S. Taubman, R. M. Williams, C. G. Bethea, K. Unterrainer, H. Y. Hwang, D. L. Sivco, A. Y. Cho, A. M. Sergent, H. C. Liu, and E. A. Whittaker, "Quantum cascade lasers: ultrahigh-speed operation, optical wireless communication, narrow linewidth, and far-infrared emission," Int. J. Quantum Chem. 38, 511-532 (2002).
20. X. Tang, K. G. Irvine, D. Zhang, and M. G. Spencer, "Linear electro-optic effect in cubic silicon carbide," Appl. Phys. Lett. 59, 1938-1940 (1991).
21. Z. Q. Li, G. M. Wang, K. J. Mikolaitis, D. Moses, A. J. Heeger, and D. N. Basov, "An infrared probe of tunable dielectrics in metal-oxide-semiconductor structures," Appl. Phys. Lett. 86, 223506-223508 (2005).
22. C. A. Zorman, A. J. Fleischman, A. S. Dewa, M. Mehregany, C. Jacob, and P. Pirouz, "Epitaxial growth of 3C-SiC films on 4 in. diam (100) silicon wafers by atmospheric pressure chemical vapor deposition," J. Appl. Phys. 78, 5136-5138 (1995).
23. D. R. Smith D. Schurig, M. Rosenbluth, S. Schultz, S. A. Ramakrishna, and J. B. Pendry, "Limitations on subdiffraction imaging with a negative refractive index slab," Appl. Phys. Lett. 82, 1506-1508 (2003).
24. R. Merlin, "Analytical solution of the almost-perfect-lens problem," Appl. Phys. Lett. 84, 1290-1292 (2004).
25. V. A. Podolskiy and E. E. Narimanov, "Near-sighted superlens," Opt. Lett. 30, 75-77 (2005).
26. C. Kittel, Introduction to Solid-State Physics, 8th Ed. (Wiley, 2005).
27. J. T. Shen and P. M. Platzman, "Near-field imaging with negative dielectric constant lenses," Appl. Phys. Lett. 80, 3286-3288 (2002).
28. G. Shvets, "Applications of surface plasmon and phonon polaritons to developing left-handed materials and nanolithography," Proc. SPIE 5221, 124-132 (2003).
29. G. Shvets and Y. Urzhumov, "Polariton-enhanced near field lithography and imaging with infrared light," Mater. Res. Soc. Symp. Proc. 820, R1.2.1 (2004).
30. D. Korobkin, Y. Urzhumov, and G. Shvets, "Far-field detection of the superlensing effect in mid-infrared: theory and experiment," J. Mod. Opt. 52, 2351-2364 (2005).
31. FEMLAB Reference Manual 2003 Version 2.3, Comsol AB, Sweden.
32. E. D. Palik, ed., Handbook of Optical Constants of Solids (Academic, 1985).
33. D. E. Aspnes, "Local field effects and effective medium theory: a microscopic perspective," Am. J. Phys. 50, 704-709 (1982).
34. S. Rohmfeld, M. Hundhausen, L. Ley, C. A. Zorman, and M. Mehregany, "Quantitative evaluation of biaxial strain in epitaxial 3C-SiC layers on Si(100) substrates by Raman spectroscopy," J. Appl. Phys. 91, 1113-1117 (2002).
35. J R. Birch and F. J. J. Clarke, "Interreflection errors in Fourier transform spectroscopy: a preliminary appraisal," Anal. Chim. Acta 380, 369-378 (1999).
36. xAs," Phys. Rev. B 69, 165204 (2003).
37. P.-O. Nilsson, "Determination of optical constants from intensity measurements at normal incidence," Appl. Opt. 7, 435-442 (1968).
38. M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge U. Press, 1999.)
39. W. G. Spitzer, D. Kleinman, and D. Walsh, "Infrared properties of hexagonal silicon carbide," Phys. Rev. 113, 127-132 (1959).