Near field imaging with negative dielectric constant lenses

Applied Physics Letters

Volumn 80, Issue 18, 2002, Pages 3286-3288

  Shen, J T ^a   Platzman, P M ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC SLABS; ELECTROSTATIC LIMITS; MICROWAVE REGIME; NEAR FIELD IMAGING; NEGATIVE DIELECTRIC; PERFECT LENS; RETARDATION EFFECT;

PHYSICAL PROPERTIES;

PHYSICS;

EID: 79957963158     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1471933     Document Type: Article

References (6)

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3. D. R. Smith, W. J. Padilla, D. C. Vier, S. C. Nemat-Nasser, and S. Schultz, Phys. Rev. Lett. 84, 4184 (2000). prl PRLTAO 0031-9007
4. P. M. Platzman and P. A. Wolff, Waves and Interactions in Solid State Plasmas, Solid State Physics, Supplement 13 (Academic, New York, 1973), pp. 77-81.
5. J. B. Pendry, Phys. Rev. Lett. 85, 3966 (2000). prl PRLTAO 0031-9007
6. J. T. Shen and P. M. Platzman (unpublished).