Using photon statistics to boost microscopy resolution

Proceedings of the National Academy of Sciences of the United States of America

Volumn 103, Issue 13, 2006, Pages 4797-4798

  Michalet, Xavier ^a   Weiss, Shimon ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX FORMATION; DIFFRACTION; FLUORESCENCE; IMAGE ANALYSIS; MICROSCOPY; NOTE; PHOTON; PRIORITY JOURNAL; SIMULATION;

DNA; MICROSCOPY; PHOTONS; SENSITIVITY AND SPECIFICITY;

EID: 33645527179     PISSN: 00278424     EISSN: None     Source Type: Journal    
DOI: 10.1073/pnas.0600808103     Document Type: Note

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