Simulation study of junction effect on field emission from one-dimensional nanostructure grown on silicon substrate

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 24, Issue 2, 2006, Pages 918-923

  Lan, Yung Chiang ^a   Yan, Mingxun ^a   Liu, Wen Jen ^b   Hu, Yuan ^c   Lin, Tsang Lang ^c  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b I SHOU UNIVERSITY   (Taiwan)

^c NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FIELD EMISSION CATHODES; NANOSTRUCTURED MATERIALS; SEMICONDUCTOR JUNCTIONS; SUBSTRATES;

FIELD-EMISSION PROPERTIES; FOWLER-NORDHEIM EQUATION; SILICON SUBSTRATE;

SILICON;

EID: 33645511599     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2165670     Document Type: Article

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