High current density field emission from arrays of carbon nanotubes and diamond-clad Si tips

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 3, 2000, Pages 1207-1211

  Tarntair, F G ^a   Chen, L C ^b   Wei, S L ^b   Hong, W K ^a   Chen, K H ^c   Cheng, H C ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CARBON; CLADDING (COATING); CURRENT DENSITY; NANOTUBES; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING DIAMONDS; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; SUBSTRATES;

DIAMOND-CLAD SILICON TIPS; FIELD EMITTER ARRAYS; FOWLER-NORDHEIM THEORY;

FIELD EMISSION CATHODES;

EID: 0034187896     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591362     Document Type: Article

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