Spectroscopic strain measurement methodology: Degree-of-polarization photoluminescence versus photocurrent spectroscopy

Applied Physics Letters

Volumn 88, Issue 13, 2006, Pages

  Tomm, Jens W ^a   Tien, Tran Quoc ^a   Cassidy, Daniel T ^b  

^a MAX BORN INSTITUT   (Germany)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOCURRENTS; PHOTOLUMINESCENCE; POLARIZATION; PRODUCT DESIGN; STRAIN MEASUREMENT;

DEGREE-OF-POLARIZATION; GROOVES; METALLIZED CONTACTS; PHOTOCURRENT SPECTROSCOPY;

SEMICONDUCTOR DEVICES;

EID: 33645503858     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2189189     Document Type: Article

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