Strain mapping by measurement of the degree of polarization of photoluminescence

Applied Optics

Volumn 43, Issue 9, 2004, Pages 1811-1818

  Cassidy, Daniel T ^a   Lam, S K K ^a   Lakshmi, B ^a   Bruce, Douglas M ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; MATRIX ALGEBRA; SEMICONDUCTING INDIUM PHOSPHIDE; STRAIN MEASUREMENT; STRESSES;

DEGREE OF POLARIZATION; SHEAR STRAIN; STRAIN MAPPING;

PHOTOLUMINESCENCE;

EID: 1942454836     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.001811     Document Type: Article

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