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Physical Review B - Condensed Matter and Materials Physics

Volumn 73, Issue 12, 2006, Pages

X-ray diffraction mapping of strain fields and chemical composition of SiGe:Si(001) quantum dot molecules

(6) Leite, M S a,b Gray, J L c Hull, R c Floro, J A d Magalhaes Paniago R a,e Medeiros Ribeiro, G a

a LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON (Brazil)

b UNIVERSITY OF CAMPINAS (Brazil)

c University of Virginia (United States)

d SANDIA NATIONAL LABORATORIES (United States)

e FEDERAL UNIVERSITY OF MINAS GERAIS (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645468079 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.73.121308 Document Type: Article

Times cited : (13)

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