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Physical Review B - Condensed Matter and Materials Physics

Volumn 73, Issue 12, 2006, Pages

Optical critical points of thin-film Ge1-y Sny alloys: A comparative Ge1-y Sny Ge1-x six study

(8) D'Costa, Vijay R a Cook, Candi S a Birdwell, A G b Littler, Chris L c Canonico, Michael d Zollner, Stefan d Kouvetakis, John a Menéndez, José a

a ARIZONA STATE UNIVERSITY (United States)

b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

c UNIVERSITY OF NORTH TEXAS (United States)

d FREESCALE SEMICONDUCTOR INC (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645456449 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.73.125207 Document Type: Article

Times cited : (357)

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