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Volumn 376-377, Issue 1, 2006, Pages 189-192
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Positron trapping at thermal vacancies in highly As-doped Si
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Author keywords
Diffusion; Positron annihilation; Silicon; Thermal vacancies
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Indexed keywords
ARSENIC;
COOLING;
DEFECTS;
ELECTRON TRAPS;
IMPURITIES;
POSITRON ANNIHILATION SPECTROSCOPY;
QUENCHING;
SEMICONDUCTOR DOPING;
SILICON;
EQUILIBRIUM TEMPERATURE MEASUREMENTS;
POSITRON DETRAPPING;
THERMAL VACANCIES;
VACANCY-IMPURITY COMPLEXES;
POSITRONS;
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EID: 33645154854
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2005.12.050 Document Type: Conference Paper |
Times cited : (2)
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References (19)
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