Resolution improvement of acoustic microimaging by continuous wavelet transform for semiconductor inspection

Microelectronics Reliability

Volumn 46, Issue 5-6, 2006, Pages 811-821

  Zhang, Guang Ming ^a   Harvey, David M ^a   Braden, Derek R ^b  

^a LIVERPOOL JOHN MOORES UNIVERSITY   (United Kingdom)

^b Delphi Electronics and Safety   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; FAILURE ANALYSIS; FREQUENCY DOMAIN ANALYSIS; MICROELECTRONICS; NONDESTRUCTIVE EXAMINATION; RELIABILITY; SEMICONDUCTOR MATERIALS; SIGNAL PROCESSING; WAVELET TRANSFORMS;

ACOUSTIC FREQUENCIES; ACOUSTIC MICROIMAGING (AMI); CONTINUOUS WAVELET TRANSFORM (CWT);

ACOUSTIC IMAGING;

EID: 33645154069     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2005.07.008     Document Type: Conference Paper

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