Broadband dielectric spectroscopy of oxidized porous silicon

Journal of Physics D: Applied Physics

Volumn 39, Issue 7, 2006, Pages 1326-1331

  Axelrod, Ekaterina ^a   Urbach, Benayahu ^a   Sa'ar, Amir ^a   Feldman, Yuri ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; INFRARED RADIATION; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OXIDATION; PHOTOLUMINESCENCE; POLARIZATION; POROUS MATERIALS; SPECTROSCOPY;

MATRIX-PORE INTERFACES; SILICON NANOCRYSTALS; TEMPERATURE RELAXATION;

SILICON;

EID: 33645098172     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/7/S06     Document Type: Article

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