Dielectric relaxation and porosity determination of porous silicon

Journal of Non-Crystalline Solids

Volumn 305, Issue 1-3, 2002, Pages 235-242

  Axelrod, E ^a   Givant, A ^a   Shappir, J ^a   Feldman, Y ^a   Sa'ar, A ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; DIELECTRIC RELAXATION; ELECTRIC CONDUCTIVITY; PHOTOLUMINESCENCE; POROSITY;

DIELECTRIC SPECTROSCOPY;

POROUS SILICON;

EID: 0036642888     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(02)01097-9     Document Type: Conference Paper

References (32)