Electrical characterization of platinum and palladium effects in nickel monosilicide/n-Si Schottky contacts

Thin Solid Films

Volumn 504, Issue 1-2, 2006, Pages 149-152

  Jin, L J ^a   Pey, K L ^a,b   Choi, W K ^a,c   Antoniadis, D A ^a,d   Fitzgerald, E A ^a,d   Chi, D Z ^e  

^a SINGAPORE MIT ALLIANCE   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^e INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

SBH inhomogeneity; Schottky barrier height (SBH); Thermionic emission model

Indexed keywords

ELECTRIC CURRENTS; MATHEMATICAL MODELS; NICKEL ALLOYS; PLATINUM ALLOYS; THERMIONIC EMISSION;

SBH INHOMOGENEITY; SCHOTTKY BARRIER HEIGHT (SBH); THERMIONIC EMISSION MODEL;

SCHOTTKY BARRIER DIODES;

EID: 33644906358     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.09.063     Document Type: Conference Paper

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