Effect of oxygen partial pressure on the dielectric properties and microstructures of cofired base-metal-electrode multilayer ceramic capacitors

Journal of the American Ceramic Society

Volumn 89, Issue 3, 2006, Pages 894-901

  Feng, Qiquan ^a,c   McConville, Caspar J ^a,c   Edwards, Doreen D ^a,c   McCauley, Daniel E ^b,c   Chu, Mike ^b,c  

^a ALFRED UNIVERSITY   (United States)

^b Ferro Corporation   (United States)

^c AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRIGHT FIELD (BF); DOPANT DISTRIBUTION; MULTILAYER CERAMIC CAPACITORS (MLCC); OXYGEN PARTIAL PRESSURE;

BARIUM TITANATE; DIELECTRIC PROPERTIES; ELECTRODES; MICROSTRUCTURE; MULTILAYERS; OXYGEN; PARTIAL PRESSURE;

CERAMIC CAPACITORS;

EID: 33644667535     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00787.x     Document Type: Article

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