Analysis of Planar Defects in Nb2O5-and Bi2O3-doped BaTiO3 Ceramics

Journal of Materials Science

Volumn 33, Issue 24, 1998, Pages 5759-5771

  Mccoy, Michael A ^a,b   Lee, William E ^a   Grimes, Robin W ^b   Keyse, Robert ^c  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; BISMUTH COMPOUNDS; DOPING (ADDITIVES); HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); MICROANALYSIS; NIOBIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

FERROELECTRIC DOMAIN BOUNDARIES; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

CERAMIC MATERIALS;

EID: 0032285516     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004485511538     Document Type: Article

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