Weak-beam dark-field microscopy of complex stress states in X7R-type BaTiO3 dielectric core-shell structures

Journal of the American Ceramic Society

Volumn 87, Issue 10, 2004, Pages 1945-1951

  Feng, Qiquan ^a   McConville, Caspar J ^a  

^a ALFRED UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; PHASE TRANSITIONS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BATIO3; STRESS STATES; WEAK-BEAM DARK-FIELD MICROSCOPY;

BARIUM COMPOUNDS;

EID: 8644283567     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2004.tb06345.x     Document Type: Article

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