-
1
-
-
0028730679
-
Silver-palladium thick-film conductors
-
S. F. Wang, and J. P. Dougherty, W. Huebner, and J. G. Pepin, "Silver-Palladium Thick-Film Conductors," J. Am. Ceram. Soc., 77 [12] 3051-72 (1994).
-
(1994)
J. Am. Ceram. Soc.
, vol.77
, Issue.12
, pp. 3051-3072
-
-
Wang, S.F.1
Dougherty, J.P.2
Huebner, W.3
Pepin, J.G.4
-
2
-
-
0033727136
-
Influence of silver migration on dielectric properties and reliability of relaxor based MLCCs
-
R. Zuo, L. Li, Z. Gui, "Influence of Silver Migration on Dielectric Properties and Reliability of Relaxor based MLCCs," Ceram. Inter. 26 [6] 673-76 (2000).
-
(2000)
Ceram. Inter.
, vol.26
, Issue.6
, pp. 673-676
-
-
Zuo, R.1
Li, L.2
Gui, Z.3
-
3
-
-
0036641475
-
TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors
-
R. Zou, L. Li, Z. Gui, T. Hung, and Z. Xu, "TEM and EDS Investigation of Heterogeneous Interfaces in Cofired Multilayer Ceramic Capacitors," Mater. Sci. & Eng. 95 [1] 1-5 (2002).
-
(2002)
Mater. Sci. & Eng.
, vol.95
, Issue.1
, pp. 1-5
-
-
Zou, R.1
Li, L.2
Gui, Z.3
Hung, T.4
Xu, Z.5
-
4
-
-
0035282178
-
Characteristics and effects of interfacial interdiffusion in composite multilayer ceramic capacitors
-
R. Zou, L. Li, Y. Tang, and Z. Gui, "Characteristics and Effects of Interfacial Interdiffusion in Composite Multilayer Ceramic Capacitors," Mater. Chem. & Phys. 69 [3] 230-35 (2001).
-
(2001)
Mater. Chem. & Phys.
, vol.69
, Issue.3
, pp. 230-235
-
-
Zou, R.1
Li, L.2
Tang, Y.3
Gui, Z.4
-
5
-
-
84986347537
-
3 relaxor dielectric ceramics
-
3 Relaxor Dielectric Ceramics," J. Am. Ceram. Soc. 78 [5] 1173-78 (1995).
-
(1995)
J. Am. Ceram. Soc.
, vol.78
, Issue.5
, pp. 1173-1178
-
-
Kanai, H.1
Furukawa, O.2
Nakamura, S.3
Hayashi, M.4
Yoshiki, M.5
Yamashita, Y.6
-
6
-
-
0035437598
-
110mAg tracer in polycrystalline and single-crystal lead-containing piezoelectric ceramics
-
110mAg Tracer in Polycrystalline and Single-Crystal Lead-Containing Piezoelectric Ceramics," J. Am. Ceram. Soc. 84 [8] 1777-84 (2001).
-
(2001)
J. Am. Ceram. Soc.
, vol.84
, Issue.8
, pp. 1777-1784
-
-
Lewis, D.J.1
Gupta, D.2
Notis, M.R.3
Imanaka, Y.4
-
7
-
-
0034224597
-
Evaporation of silver during cofiring with barium titanate
-
C. Y. Chen and W. H. Tuan, "Evaporation of Silver during Cofiring with Barium Titanate," J. Am. Ceram. Soc., 83 [7] 1693-98 (2000).
-
(2000)
J. Am. Ceram. Soc.
, vol.83
, Issue.7
, pp. 1693-1698
-
-
Chen, C.Y.1
Tuan, W.H.2
-
8
-
-
0034516141
-
Effect of silver on the sintering and grain-growth behavior of barium titanate
-
C. Y. Chen and W. H. Tuan, "Effect of Silver on the Sintering and Grain-Growth Behavior of Barium Titanate," J. Am. Ceram. Soc., 83 [12] 2988-92 (2000).
-
(2000)
J. Am. Ceram. Soc.
, vol.83
, Issue.12
, pp. 2988-2992
-
-
Chen, C.Y.1
Tuan, W.H.2
-
9
-
-
0038206777
-
Effect of silver addition on the dielectric properties of barium titanate-based X7R ceramics
-
R. Z. Chen, X. H. Wang, Z. L Gui and L. T. Li, "Effect of Silver Addition on the Dielectric Properties of Barium Titanate-Based X7R Ceramics," J. Am. Ceram. Soc. 86 [6] 1022-24 (2003).
-
(2003)
J. Am. Ceram. Soc.
, vol.86
, Issue.6
, pp. 1022-1024
-
-
Chen, R.Z.1
Wang, X.H.2
Gui, Z.L.3
Li, L.T.4
-
10
-
-
0019180862
-
Progress in and technology of low cost silver containing thick film conductors
-
B. E. Taylor, J. J. Felten, and J. R. Larry, "Progress in and Technology of Low Cost Silver Containing Thick Film Conductors," IEEE Trans. Compon., Hybrid, Manuf. Technol., CHMT-3 [2] 504-17 (1980).
-
(1980)
IEEE Trans. Compon., Hybrid, Manuf. Technol.
, vol.CHMT-3
, Issue.2
, pp. 504-517
-
-
Taylor, B.E.1
Felten, J.J.2
Larry, J.R.3
-
11
-
-
0026057306
-
Degradation of mulitlayer ceramic capacitors with nickel electrodes
-
S. Sumita, M. Lkeda, Y. Nakano, K. Nishiyama and T. Nomura, "Degradation of Mulitlayer Ceramic Capacitors with Nickel Electrodes, " J. Am. Ceram. Soc., 74 [11] 2739-46 (1991).
-
(1991)
J. Am. Ceram. Soc.
, vol.74
, Issue.11
, pp. 2739-2746
-
-
Sumita, S.1
Lkeda, M.2
Nakano, Y.3
Nishiyama, K.4
Nomura, T.5
-
12
-
-
85047670836
-
3 ceramic under a high DC electric field
-
3 Ceramic under a High DC Electric Field," J. Mater. Sci., 19 [11] 3515-23 (1984).
-
(1984)
J. Mater. Sci.
, vol.19
, Issue.11
, pp. 3515-3523
-
-
Rodel, J.1
Tomandl, G.2
-
13
-
-
0000413466
-
A grinding/polishing tool for TEM sample preparation
-
Materials Research Society Symposium Proceedings, Edited by J. C. Bravman, R. M. Anderson, and M. L. McDonald, Materials Research Society, Pittsburgh, PA
-
S. J. Klepeis, J. P. Benedict and R. M. Anderson, "A Grinding/Polishing Tool for TEM Sample Preparation," pp. 179-184 in Materials Research Society Symposium Proceedings, Vol. 115, Specimen Preparation for Transmission Electron Microscopy of Materials. Edited by J. C. Bravman, R. M. Anderson, and M. L. McDonald, Materials Research Society, Pittsburgh, PA, 1988.
-
(1988)
Specimen Preparation for Transmission Electron Microscopy of Materials
, vol.115
, pp. 179-184
-
-
Klepeis, S.J.1
Benedict, J.P.2
Anderson, R.M.3
-
14
-
-
0000193674
-
A procedure for cross sectioning specific semiconductor devices for both SEM and TEM analysis
-
Materials Research Society Symposium Proceedings, Edited by R. M. Anderson, Materials Research Society, Pittsburgh, PA
-
J. P. Benedict, R. M. Anderson, S. J. Klepeis, and M. Chaker, "A Procedure for Cross Sectioning Specific Semiconductor Devices for Both SEM and TEM Analysis," pp. 189-204 in Materials Research Society Symposium Proceedings, Vol. 199, Specimen Preparation for Transmission Electron Microscopy of Materials. Edited by R. M. Anderson, Materials Research Society, Pittsburgh, PA, 1990.
-
(1990)
Specimen Preparation for Transmission Electron Microscopy of Materials
, vol.199
, pp. 189-204
-
-
Benedict, J.P.1
Anderson, R.M.2
Klepeis, S.J.3
Chaker, M.4
-
15
-
-
33644564274
-
A procedure for cross-sectioning materials for TEM analysis without ion milling
-
R. Anderson, S. Klepeis, and J. Benedict, "A Procedure for Cross-Sectioning Materials for TEM Analysis without Ion Milling," South Bay Technology's Technical Library, Report Number 33
-
South Bay Technology's Technical Library, Report Number 33
, vol.33
-
-
Anderson, R.1
Klepeis, S.2
Benedict, J.3
-
18
-
-
0035324296
-
Microstructural investigation of barium titanate-based material for base metal electrode ceramic multilayer capacitor
-
C. Metzmacher and K. Albertsen, "Microstructural Investigation of Barium Titanate-Based Material for Base Metal Electrode Ceramic Multilayer Capacitor," J. Am. Ceram. Soc., 84 [4] 821-26 (2001).
-
(2001)
J. Am. Ceram. Soc.
, vol.84
, Issue.4
, pp. 821-826
-
-
Metzmacher, C.1
Albertsen, K.2
-
19
-
-
0025448039
-
DC electrical degradation of perovskite-type titanates: I, ceramics
-
R. Waser, T. Baiatu and K. H. Hardfl, "DC Electrical Degradation of Perovskite-Type Titanates: I, Ceramics," J. Am. Ceram. Soc., 73 [6] 1645-53 (1990).
-
(1990)
J. Am. Ceram. Soc.
, vol.73
, Issue.6
, pp. 1645-1653
-
-
Waser, R.1
Baiatu, T.2
Hardfl, K.H.3
-
20
-
-
0025449170
-
DC electrical degradation of perovskite-type titanates: II, single crystals
-
R. Waser, T. Baiatu and K. H. Hardfl, "DC Electrical Degradation of Perovskite-Type Titanates: II, Single Crystals," J. Am. Ceram. Soc., 73 [6] 1654-62 (1990).
-
(1990)
J. Am. Ceram. Soc.
, vol.73
, Issue.6
, pp. 1654-1662
-
-
Waser, R.1
Baiatu, T.2
Hardfl, K.H.3
-
21
-
-
0025448040
-
DC electrical degradation of perovskite-type titanates: III, A model of the mechanism
-
R. Waser, T. Baiatu and K. H. Hardfl, "DC Electrical Degradation of Perovskite-Type Titanates: III, A Model of the Mechanism," J. Am. Ceram. Soc., 73 [6] 1663-73 (1990).
-
(1990)
J. Am. Ceram. Soc.
, vol.73
, Issue.6
, pp. 1663-1673
-
-
Waser, R.1
Baiatu, T.2
Hardfl, K.H.3
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