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Volumn 167, Issue , 2005, Pages 329-336

Electron microscopy of heterogeneous interfaces in cofired noble and base Metal Electrode Multilayer Ceramic Capacitors (MLCCS)

Author keywords

[No Author keywords available]

Indexed keywords

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); DIELECTRIC LAYERS; INSULATION RESISTANCE; MULTILAYER CERAMIC CAPACITORS (MLCC);

EID: 23744456383     PISSN: 10421122     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (23)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.