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Volumn 151, Issue 3, 2006, Pages 199-203
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Thickness dependence of X-ray absorption and photoemission in Fe thin films on Si(0 0 1)
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Author keywords
Fe Si(0 0 1); Interface; Valence band photoemission; X ray absorption spectroscopy
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Indexed keywords
FILM GROWTH;
IRON;
LIGHT ABSORPTION;
PHOTOEMISSION;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
FE/SI(0 0 1);
INTERFACES;
VALENCE BAND PHOTOEMISSION;
X-RAY ABSORPTION SPECTROSCOPY;
X RAYS;
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EID: 33644618719
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2005.12.006 Document Type: Article |
Times cited : (17)
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References (21)
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