메뉴 건너뛰기




Volumn 151, Issue 3, 2006, Pages 199-203

Thickness dependence of X-ray absorption and photoemission in Fe thin films on Si(0 0 1)

Author keywords

Fe Si(0 0 1); Interface; Valence band photoemission; X ray absorption spectroscopy

Indexed keywords

FILM GROWTH; IRON; LIGHT ABSORPTION; PHOTOEMISSION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33644618719     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.12.006     Document Type: Article
Times cited : (17)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.