The probing depth of total electron yield in the sub-keV range: TEY-XAS and X-PEEM

Surface Science

Volumn 537, Issue 1-3, 2003, Pages 161-167

  Frazer, Bradley H ^a,b,d   Gilbert, Benjamin ^c   Sonderegger, Brandon R ^a   De Stasio, Gelsomina ^a  

^a University of Wisconsin Madison   (United States)

^b EPFL   (Switzerland)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

Chromium; X ray absorption spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LEVELS; SCANNING ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

PROBING DEPTHS;

ELECTRON ABSORPTION;

EID: 0037900662     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00613-7     Document Type: Article

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