Investigation of the Fe/Si interface and its phase transformations

Surface Science

Volumn 377-379, Issue , 1997, Pages 529-533

  Fanciulli, M ^a   Degroote, S ^b   Weyer, G ^a   Langouche, G ^b  

^a AARHUS UNIVERSITY   (Denmark)

^b KU LEUVEN   (Belgium)

Author keywords

Interface states; Iron; Molecular beam epitaxy; M ssbauer spectroscopy; Silicon; Suicides

Indexed keywords

ANNEALING; ELECTRON SPECTROSCOPY; EVAPORATION; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; MOSSBAUER SPECTROSCOPY; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

CONVERSION ELECTRON MOESSBAUER SPECTROSCOPY (CEMS); RECONSTRUCTED SILICON SURFACES;

SEMICONDUCTING SILICON;

EID: 17744416144     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01429-X     Document Type: Article

References (27)

1. T. Urano and T. Kanaji, Appl. Surf. Sci. 33/34 (1988) 68.
2. M. De Crescenzi, G. Gaggiotti, N. Motta, F. Patella, A. Balzarotti and J. Derrien, Phys. Rev. B 42 (1990) 5871.
3. Y. Ufuktepe and M. Onellion, Solid State Commun. 76 (1990) 191.
4. H.S. Zeng, X. Wallart, J.P. Nys, G. Dalmai and P. Friedel, Phys. Rev. B 44 (1991) 13811.
5. B. Li, M. Ji and J. Wu, J. Appl. Phys. 68 (1990) 1099.
6. H. Moritz, B. Rosen, S. Popovic, A. Rizzi and H. Lüth, J. Vac. Sci. Technol. B 10 (1992) 1704.
7. E.V. Chubunova, I.D. Khabelashvili, Yu.Yu. Lebedinkii, V.N. Nevolin and A. Zenkevich, Thin Solid Films 247 (1994) 39.
8. S. Kennou, N. Cherief, R.C. Cinti and T.A. Nguyen Tan, Surf. Sci. 211/212 (1989) 685.
9. K. Konuma, J. Vrijmoeth. P.M. Zagwijn, J.W.M. Frenken, E. Vlieg and J.F. van der Veen, J. Appl. Phys. 73 (1993) 1104.
10. J.M. Gallego and R. Miranda, J. Appl. Phys. 69 (1991) 1377.
11. J.M. Gallego, J.M. Garcia, J. Alvarez and R. Miranda, Phys. Rev. B 46 (1992) 13339.
12. M. Hasegawa, N. Kobayashi and N. Hayashi, Mater. Res. Soc. Symp. Proc. 402 (1996) 529.
13. J. Alvarez, A.L. Vazquez de Parga, J.J. Hinarejos, J. de la Figuera, E.G. Michel, C. Ocal and R. Miranda, Phys. Rev. B 47 (1993) 16048.
14. H. von Känel, K.A. Mäder, E. Müller, N. Onda and H. Sirringhaus, Phys. Rev. B 45 (1992) 13807.
15. M. Fanciulli, G. Weyer, H.H. von Känel and N. Onda, Phys. Scr. T54 (1994) 16.
16. M. Fanciulli, C. Rosenblad, G. Weyer, H. von Känel and N. Onda, Thin Solid Films 275 (1996) 8.
17. M. Fanciulli, C. Rosenblad, G. Weyer, A. Svane, N.E. Christensen and H. von Känel, Phys. Rev. Lett. 75 (1995) 1642.
18. S. Degroote, M.H. Langelaar, T. Kobayashi, J. Dekoster, J. De Wachter, R. Moons, L. Niesen and G. Langouche, Mater. Res. Soc. Symp. Proc. 320 (1993) 133.
19. S. Degroote, T. Kobayashi, J. Dekoster, A. Vantomme and G. Langouche, Mater. Res. Soc. Symp. Proc. 337 (1994) 685.
20. M. Fanciulli, C. Rosenblad, G. Weyer, H. von Känel, N. Onda, V. Nevolin and A. Zenkevich, Mater. Res. Soc. Symp. Proc. 402 (1996) 319.
21. Y. Morita, K. Miki and H. Tokumoto, Appl. Phys. Lett. 59 (1991) 1347.
22. G. Weyer, Mössbauer Effect Methodology 10 (1976) 301.
23. P. Schwalbach, S. Laubach, M. Hartick, E. Kankeleit, B. Keck, M. Menningen and R. Sielemann, Phys. Rev. Lett. 64 (1990) 1274.
24. F.G. Allen, Bull. Am. Phys. Soc. 9 (1964) 296.
25. E.R. Weber, Appl. Phys. A 30 (1983) 1.
26. K.N. Tu, Appl. Phys. Lett. 27 (1975) 221.
27. M. Fanciulli, A. Zenkevich, I. Wenneker, A. Svane, N.E. Christensen and G. Weyer, Phys. Rev. B 54 (1996) 15985.