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Volumn 5991, Issue , 2005, Pages

Utilization of magnetorheological finishing as a diagnostic tool for investigating the three-dimensional structure of fractures in fused silica

Author keywords

Brittle fracture; Laser induced damage; MRF; Subsurface damage; Surface imperfections

Indexed keywords

MRF; SUBSURFACE DAMAGE; SURFACE IMPERFECTIONS;

EID: 33644589343     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.638840     Document Type: Conference Paper
Times cited : (12)

References (22)
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  • 14
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    • MRF applications: Measurement of process-dependent subsurface damage in optical materials using the MRF wedge technique
    • this proceedings, Boulder, Co
    • J. A. Menapace, P. J. Davis, W. A. Steele, L. L. Wong, T. I. Suratwala, and P. E. Miller, "MRF Applications: Measurement of Process-dependent Subsurface Damage in Optical Materials using the MRF Wedge Technique", Laser Induced Damage in Optical Materials, this proceedings, Boulder, Co (2005).
    • (2005) Laser Induced Damage in Optical Materials
    • Menapace, J.A.1    Davis, P.J.2    Steele, W.A.3    Wong, L.L.4    Suratwala, T.I.5    Miller, P.E.6
  • 15
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    • Influence of the structural relaxation on the indentation behavior of the surface of silica optical fibers
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    • Similar observations for Vickers indentations have been made by N. Gougeon, R. El Abdi, and M. Poulain, "Influence of the structural relaxation on the indentation behavior of the surface of silica optical fibers", World Conference on Non-destructive Testing, Montreal Canada (2004).
    • (2004) World Conference on Non-destructive Testing
    • Gougeon, N.1    El Abdi, R.2    Poulain, M.3
  • 16
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    • Reflection and transmission of radiation by metal films and the influence of nonabsorbing backings
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    • Harris, L.1    Beasley, J.K.2    Loeb, A.L.3
  • 17
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    • Effects of phase changes on reflection and their wavelength dependence in optical profilometry
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    • Doi, T.1    Toyoda, K.2    Tanimura, Y.3
  • 18
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    • Offset of coherent envelop position due to phase change on reflection
    • A. Harasaki, J. Schmitt, and J.C. Wyant, "Offset of coherent envelop position due to phase change on reflection", Applied Optics, 40, 2102-2105 (2001).
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    • Harasaki, A.1    Schmitt, J.2    Wyant, J.C.3
  • 19
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    • Reply to comments on effects of ultrahigh pressure on glass
    • H. M. Cohen and R. Roy, "Reply to Comments on Effects of Ultrahigh Pressure on Glass", Journal of the American Ceramics Society, 45, 398-399 (1962).
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  • 20
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    • High-pressure effects on oxide glasses: 1, densification in rigid state
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    • Mackenzie, J.D.1
  • 21
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    • Role of densification in deformation of glass under point loading
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    • Ernsberger, F.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.