Convergent-Beam Low Energy Electron Diffraction (CBLEED) and the Measurement of Surface Dipole Layers

Microscopy and Microanalysis

Volumn 10, Issue 1, 2004, Pages 128-133

  Spence, J C H ^a   Poon, H C ^b   Saldin, D K ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

Convergent beam; Dipole layer; LEED; Nanoprobe

Indexed keywords

CONFERENCE PAPER; CRYSTALLOGRAPHY; ELECTRON; ELECTRON MICROSCOPY; INSTRUMENTATION; METHODOLOGY; SURFACE PROPERTY;

CRYSTALLOGRAPHY; ELECTRONS; MICROSCOPY, ELECTRON; SURFACE PROPERTIES;

EID: 1442338798     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040346     Document Type: Conference Paper

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