Growth of subnanometer-thin Si overlayer on TiO 2 (1 1 0)-( 1×2 ) surface

Applied Surface Science

Volumn 234, Issue 1-4, 2004, Pages 497-502

  Abad, J ^a   Rogero, C ^a   Mendez J ^a   Lopez M F ^a   Martin Gago J A ^a   Roman E ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Low energy electron diffraction (LEED); Rutile; Scanning tunneling microscopy (STM); Silicon; Silicon oxide; Surface oxidation; Titanium oxide; Ultraviolet photoelectron spectroscopy (UPS); X ray photoelectron spectroscopy (XPS)

Indexed keywords

CATALYSIS; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; MOS DEVICES; OXIDATION; PYROMETERS; SCANNING TUNNELING MICROSCOPY; TITANIUM COMPOUNDS; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

RUTILES; SILICON OXIDES; SUBNANOMETERS; SURFACE OXIDATION;

SILICON;

EID: 3342978890     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.082     Document Type: Conference Paper

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