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Volumn 410, Issue 2-3, 1998, Pages 250-257

Superficial defects induced by argon and oxygen bombardments on (110) TiO2 surfaces

Author keywords

AES; Single crystal surfaces; Surface defects; Tio2; XPS

Indexed keywords

ARGON; DEFECTS; OXYGEN; SINGLE CRYSTALS; STOICHIOMETRY; SURFACE CHEMISTRY; SURFACE STRUCTURE; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032140136     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00297-0     Document Type: Article
Times cited : (115)

References (17)
  • 16
    • 0003828439 scopus 로고
    • Auger and X-ray Photoelectron Spectroscopy, Wiley, New York
    • D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, 2nd ed., Vol. 1, Auger and X-ray Photoelectron Spectroscopy, Wiley, New York, 1990.
    • (1990) Practical Surface Analysis, 2nd Ed. , vol.1
    • Briggs, D.1    Seah, M.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.