Engineering meter-scale laser resistant coatings for the near IR

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5963, Issue , 2005, Pages

  Stolz, Christopher J ^a   Adams, John ^a   Shirk, Michael D ^a   Norton, Mary A ^a   Weiland, Timothy L ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Damage mitigation; Defects; Electric field; HfO 2; Laser damage; Optical thin films; SiO 2

Indexed keywords

DAMAGE MITIGATION; HFO 2; OPTICAL THIN FILMS;

DEFECTS; ELECTRIC FIELDS; LASER DAMAGE; MICROMACHINING; THIN FILMS;

OPTICAL COATINGS;

EID: 33144480309     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.625422     Document Type: Conference Paper

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