High-spatial-resolution studies of UV-laser-damage morphology in SiO 2 thin films with artificial defects

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5647, Issue , 2005, Pages 141-155

  Papernov, S ^a   Schmid, A W ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

Atomic force microscopy; Gold nanoparticles; Laser induced damage; Thin films

Indexed keywords

GOLD NANOPARTICLES; HIGH-RESOLUTION METHODS; LASER-QUALITY COATINGS; THIN-FILM DEFECTS;

ATOMIC FORCE MICROSCOPY; ELECTRON ENERGY ANALYZERS; GOLD; LASER DAMAGE; NANOSTRUCTURED MATERIALS; NATURAL FREQUENCIES; THIN FILMS;

SILICA;

EID: 18744401364     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.584899     Document Type: Conference Paper

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