메뉴 건너뛰기




Volumn 1 A, Issue , 2005, Pages 129-136

Nonlinear dynamic analysis and chaotic behavior in atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; DYNAMICS; FOURIER TRANSFORMS; PARAMETER ESTIMATION; VAN DER WAALS FORCES;

EID: 33144463363     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/detc2005-84822     Document Type: Conference Paper
Times cited : (11)

References (20)
  • 1
    • 3142766062 scopus 로고    scopus 로고
    • A review of atomic force microscopy imaging systems: Application to molecular metrology and biological sciences
    • Jalili, N. and Laxminarayana, K., 2004, "A Review of Atomic Force Microscopy Imaging Systems: Application to Molecular Metrology and Biological Sciences", International Journal of Mechatronics, 14 (8), pp. 907-945.
    • (2004) International Journal of Mechatronics , vol.14 , Issue.8 , pp. 907-945
    • Jalili, N.1    Laxminarayana, K.2
  • 2
    • 0033524572 scopus 로고    scopus 로고
    • Microstructural properties of super alloys investigated by nanoindentations in an atomic force microscope
    • Goeken, M. and Kempf, M., 1999, "Microstructural Properties of Super alloys Investigated by Nanoindentations in an Atomic Force Microscope," ActaMater., 47(3), pp. 1043-1052.
    • (1999) ActaMater. , vol.47 , Issue.3 , pp. 1043-1052
    • Goeken, M.1    Kempf, M.2
  • 3
    • 26544437942 scopus 로고    scopus 로고
    • Nanohardness measurements for studying local mechanical properties of metals
    • Kempf, M., Goken, M. and Vehoff, H., 1998, "Nanohardness Measurements for Studying Local Mechanical Properties of Metals," Appl. Phys. A: Mater. Sci. Process., 66, pp. S843-S846.
    • (1998) Appl. Phys. A: Mater. Sci. Process. , vol.66
    • Kempf, M.1    Goken, M.2    Vehoff, H.3
  • 5
    • 17044451406 scopus 로고    scopus 로고
    • Novel method to map and quantify wear on a micro-scale
    • Gahlin, R. and Jacobson, S., 1998, "Novel Method to Map and Quantify Wear on a Micro-Scale," Wear, 222(2), pp. 93-102.
    • (1998) Wear , vol.222 , Issue.2 , pp. 93-102
    • Gahlin, R.1    Jacobson, S.2
  • 6
    • 0032593834 scopus 로고    scopus 로고
    • Evaluation of mechanical properties in nanometer scale using AFM-based nanoindentation tester
    • Miyahara, K., Nagashima, N., Ohmura, T. and Matsuoka, S., 1999, "Evaluation of Mechanical Properties in Nanometer Scale Using AFM-Based Nanoindentation Tester," Nanostruct. Mater., 12(5), pp. 1049-1052.
    • (1999) Nanostruct. Mater. , vol.12 , Issue.5 , pp. 1049-1052
    • Miyahara, K.1    Nagashima, N.2    Ohmura, T.3    Matsuoka, S.4
  • 7
    • 0035262037 scopus 로고    scopus 로고
    • Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultrathin hard amorphous carbon coatings
    • Sundararajan, S. and Bhushan, B., 2001, "Development of a Continuous Microscratch Technique in an Atomic Force Microscope and Its Application to Study Scratch Resistance of Ultrathin Hard Amorphous Carbon Coatings," J. Mater. Res., 16(2), pp. 437-445.
    • (2001) J. Mater. Res. , vol.16 , Issue.2 , pp. 437-445
    • Sundararajan, S.1    Bhushan, B.2
  • 8
    • 36449002888 scopus 로고
    • Coulomb blockade at 77 K in nanoscale metallic islands in a lateral nanostructure
    • Chen, W., Ahmed, H. and Nakazoto, K., 1995, "Coulomb Blockade at 77 K in Nanoscale Metallic Islands in a Lateral Nanostructure," Appl. Phys. Lett., 66(24), p. 3383.
    • (1995) Appl. Phys. Lett. , vol.66 , Issue.24 , pp. 3383
    • Chen, W.1    Ahmed, H.2    Nakazoto, K.3
  • 10
    • 0031238258 scopus 로고    scopus 로고
    • Electrostatic trapping of single conducting nanoparticles between nanoelectrodes
    • Bezryadin, A., Dekker, C. and Schmid, G., 1997, "Electrostatic Trapping of Single Conducting Nanoparticles Between Nanoelectrodes," Appl. Phys. Lett., 71(9), pp. 1273-1275.
    • (1997) Appl. Phys. Lett. , vol.71 , Issue.9 , pp. 1273-1275
    • Bezryadin, A.1    Dekker, C.2    Schmid, G.3
  • 11
    • 3142715718 scopus 로고    scopus 로고
    • A fresh insight into the microcantilever-sample interaction problem in non-contact atomic force microscopy
    • Jalili, N., Dadfarnia, M. and Dawson, D. M., 2004 "A Fresh Insight into the Microcantilever-Sample Interaction Problem in Non-Contact Atomic Force Microscopy", ASME Journal of Dynamic Systems, Measurements and Control, 126 (2), pp. 327-335.
    • (2004) ASME Journal of Dynamic Systems, Measurements and Control , vol.126 , Issue.2 , pp. 327-335
    • Jalili, N.1    Dadfarnia, M.2    Dawson, D.M.3
  • 14
    • 0032598751 scopus 로고    scopus 로고
    • Dynamical analysis and control of microcantilevers
    • Ashhab, M., Salapaka, M., Dahleh, M. and Mezic, I., 1999, "Dynamical Analysis and Control of Microcantilevers," Automatica, 35, pp. 1663-1670.
    • (1999) Automatica , vol.35 , pp. 1663-1670
    • Ashhab, M.1    Salapaka, M.2    Dahleh, M.3    Mezic, I.4
  • 15
    • 0033355805 scopus 로고    scopus 로고
    • Robust output high-gain feedback controllers for the atomic force microscope under high data sampling rate
    • Kohala Coast-Island, HI
    • Hsu, S. and Fu, L. 1999, "Robust Output High-Gain Feedback Controllers for the Atomic Force Microscope Under High Data Sampling Rate, " Proceedings of the IEEE International Conference on Control Applications, Kohala Coast-Island, HI, pp. 1626-1631.
    • (1999) Proceedings of the IEEE International Conference on Control Applications , pp. 1626-1631
    • Hsu, S.1    Fu, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.