Poisson's ratio measurement in tungsten thin films combining an x-ray diffractometer with in situ tensile tester

Applied Physics Letters

Volumn 73, Issue 14, 1998, Pages 1952-1954

  Renault, P O ^a   Badawi, K F ^a   Bimbault, L ^a   Goudeau, Ph ^a   Elkaim E ^b   Lauriat, J P ^b  

^a UNIVERSITÉ DE POITIERS   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001336982     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122332     Document Type: Article

References (20)

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