Ab-initio calculation of elastic constants of TiN

Surface and Coatings Technology

Volumn 142-144, Issue , 2001, Pages 125-131

  Zhang, M ^a   He, J ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Elastic constant; Internal stress; Thin film; X Ray diffraction

Indexed keywords

ELASTIC MODULI; GRAIN SIZE AND SHAPE; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; SINGLE CRYSTALS; STRAIN; STRESS ANALYSIS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

COHESION ENERGY CURVES; ELASTIC CONSTANTS;

TITANIUM NITRIDE;

COATING; DIFFRACTION; FILM; TITANIUM NITRIDE; X-RAY;

EID: 0035387560     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(01)01221-X     Document Type: Article

References (19)