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Nature
Volumn 406, Issue 6799, 2000, Pages 1023-1026
The drive to miniaturization
Author keywords

[No Author keywords available]
Indexed keywords

DIELECTRIC CONSTANT; ELECTRONICS; INTEGRATED CIRCUIT; MICROELECTRODE; PRIORITY JOURNAL; REVIEW; SEMICONDUCTOR; TECHNOLOGY; THICKNESS;
EID: 0034738980     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/35023223     Document Type: Review
Times cited : (398)
References (4)
  • 1
    • 0000793139 scopus 로고
    • Cramming more components onto integrated circuits
    • Moore, G. E. Cramming more components onto integrated circuits. Electronics 38, 114-116 (1965).
    • (1965) Electronics , vol.38 , pp. 114-116
    • Moore, G.E.1
  • 3
    • 0016116644 scopus 로고
    • Design of ion-implanted MOSFETs with very small physical dimensions
    • Dennard, R. H. et al. Design of ion-implanted MOSFETs with very small physical dimensions. IEEE J. Solid State Circuits SC-9, 256-268 (1974).
    • (1974) IEEE J. Solid State Circuits , vol.SC-9 , pp. 256-268
    • Dennard, R.H.1
  • 4
    • 0001088148 scopus 로고    scopus 로고
    • Performance degradation of small silicon devices caused by long-range coulomb interactions
    • Fischetti, M. V. & Laux, S. E. Performance degradation of small silicon devices caused by long-range Coulomb interactions. Appl. Phys. Lett. 76, 2277-2279 (2000).
    • (2000) Appl. Phys. Lett. , vol.76 , pp. 2277-2279
    • Fischetti, M.V.1    Laux, S.E.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.