High temperature elastic constant prediction of some group III-nitrides

MRS Internet Journal of Nitride Semiconductor Research

Volumn 6, Issue , 2001, Pages

  Reeber, Robert R ^a   Wang, Kai ^a  

^a North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; HIGH TEMPERATURE EFFECTS; RESIDUAL STRESSES; SEMICONDUCTING FILMS; THERMAL EXPANSION; THERMAL STRESS; THERMOELASTICITY; THIN FILMS;

DEBYE TEMPERATURE; ELASTIC CONSTANTS; ELECTRON DISTRIBUTION;

NITRIDES;

EID: 3242813816     PISSN: 10925783     EISSN: None     Source Type: Journal    
DOI: 10.1557/S1092578300000156     Document Type: Article

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