A possibility of XANAM (X-ray aided non-contact atomic force microscopy)

Chemistry Letters

Volumn 33, Issue 5, 2004, Pages 636-637

  Suzuki, Shushi ^a   Koike, Yuichiro ^a   Fujikawa, Keisuke ^a   Chun, Wang Jae ^a   Nomura, Masaharu ^b   Asakura, Kiyotaka ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b National Laboratory for High Energy Physics   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ENGINEERING; FREQUENCY ANALYSIS; MEASUREMENT; RADIATION ENERGY; SURFACE PROPERTY; X RAY; X RAY ANALYSIS;

EID: 3242777716     PISSN: 03667022     EISSN: None     Source Type: Journal    
DOI: 10.1246/cl.2004.636     Document Type: Article

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