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Volumn 22, Issue 3, 2004, Pages 1495-1498

Similarities between Ga 0.48In 0.52N yP 1-y and Ga 0.92In 0.08N yAs 1-y grown on GaAs (001) substrates

Author keywords

[No Author keywords available]

Indexed keywords

BANDGAP ENERGY; GAS-SOURCE MOLECULAR BEAM EPITAXY (GSMBE); PHILLIPS X-RAY DIFFRACTOMETER; X-RAY ROCKING CURVE (XRC) MEASUREMENTS;

EID: 3242733123     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.