-
3
-
-
0006914686
-
-
A. Belkind, E. Ezell, W. Gerristead, Z. Orban, P. Rafalko, D. Dow, J. Felts, and R. Laird, J. Vac. Sci. Technol. A 9, 530 (1991).
-
(1991)
J. Vac. Sci. Technol. A
, vol.9
, pp. 530
-
-
Belkind, A.1
Ezell, E.2
Gerristead, W.3
Orban, Z.4
Rafalko, P.5
Dow, D.6
Felts, J.7
Laird, R.8
-
5
-
-
0011934516
-
-
B. J. Pond, J. I. Debar, C. K. Carnaglia, and T. Raj, Appl. Opt. 28, 2800 (1989).
-
(1989)
Appl. Opt.
, vol.28
, pp. 2800
-
-
Pond, B.J.1
Debar, J.I.2
Carnaglia, C.K.3
Raj, T.4
-
6
-
-
36449001268
-
-
N. S. Gluck, H. Sankur, J. Heuer, J. DeNatale, and W. J. Gunning, J. Appl. Phys. 69, 3037 (1991).
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 3037
-
-
Gluck, N.S.1
Sankur, H.2
Heuer, J.3
DeNatale, J.4
Gunning, W.J.5
-
7
-
-
0000097198
-
-
W. J. Gunning, R. L. Hall, F. J. Woodberry, W. H. Southwell, and N. S. Gluck, Appl. Opt. 28, 2945 (1989).
-
(1989)
Appl. Opt.
, vol.28
, pp. 2945
-
-
Gunning, W.J.1
Hall, R.L.2
Woodberry, F.J.3
Southwell, W.H.4
Gluck, N.S.5
-
9
-
-
0032287978
-
-
J. S. Petersen, M. McCallum, N. Kachwala, R. J. Socha, J. F. Chen, T. Laiding, B. W. Smith, R. Gordon, and C. A. Mack, Proc. SPIE 3546, 288 (1998).
-
(1998)
Proc. SPIE
, vol.3546
, pp. 288
-
-
Petersen, J.S.1
McCallum, M.2
Kachwala, N.3
Socha, R.J.4
Chen, J.F.5
Laiding, T.6
Smith, B.W.7
Gordon, R.8
Mack, C.A.9
-
10
-
-
0032645538
-
-
Y. H. Kim, J. H. Park, K. H. Lee, S. W. Choi, H. S. Yoon, and J. M. Sohn, Proc. SPIE 3748, 332 (1999).
-
(1999)
Proc. SPIE
, vol.3748
, pp. 332
-
-
Kim, Y.H.1
Park, J.H.2
Lee, K.H.3
Choi, S.W.4
Yoon, H.S.5
Sohn, J.M.6
-
11
-
-
24544470510
-
-
Washington, DC
-
N. Yoshioka, J. Miyazaki, H. Kusunose, K. Hosuno, M. Nakajima, H. Morimoto, Y. Watakabe, and K. Tsukamoto, Tech. Dig. - Int. Electron Devices Meeting, Washington, DC, 1993.
-
(1993)
Tech. Dig. - Int. Electron Devices Meeting
-
-
Yoshioka, N.1
Miyazaki, J.2
Kusunose, H.3
Hosuno, K.4
Nakajima, M.5
Morimoto, H.6
Watakabe, Y.7
Tsukamoto, K.8
-
12
-
-
3242730118
-
-
S. Ito, T. Iwamatsu, H. Sato, M. Asano, K. Kawano, and F. Miyashita, J. Vac. Sci. Technol. B 14, 4199 (1996).
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 4199
-
-
Ito, S.1
Iwamatsu, T.2
Sato, H.3
Asano, M.4
Kawano, K.5
Miyashita, F.6
-
13
-
-
0034316499
-
-
E. Kim, S. Y. Moon, Y. H. Kim, H. S. Yoon, and K. No, Opt. Eng. 39, 2947 (2000).
-
(2000)
Opt. Eng.
, vol.39
, pp. 2947
-
-
Kim, E.1
Moon, S.Y.2
Kim, Y.H.3
Yoon, H.S.4
No, K.5
-
14
-
-
0031363219
-
-
T. Matsuo, K. Ohkubo, T. Haraguchi, and K. Ueyama, Proc. SPIE 3096, 354 (1997).
-
(1997)
Proc. SPIE
, vol.3096
, pp. 354
-
-
Matsuo, T.1
Ohkubo, K.2
Haraguchi, T.3
Ueyama, K.4
-
15
-
-
0031554187
-
-
P. F. Carcia, R. H. French, M. H. Reilly, M. F. Lemon, and D. J. Jones, Appl. Phys. Lett. 70, 2371 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 2371
-
-
Carcia, P.F.1
French, R.H.2
Reilly, M.H.3
Lemon, M.F.4
Jones, D.J.5
-
17
-
-
0027912292
-
-
J. V. Stebut, S. Febvay, B. Stauder, J. Lepage, J. M. Brion, B. Sander, and G. Pierson, Surf. Coat. Technol. 60, 458 (1993).
-
(1993)
Surf. Coat. Technol.
, vol.60
, pp. 458
-
-
Stebut, J.V.1
Febvay, S.2
Stauder, B.3
Lepage, J.4
Brion, J.M.5
Sander, B.6
Pierson, G.7
-
22
-
-
0030411472
-
-
S. B. Qadri, J. S. Horwitz, D. B. Christey, E. P. Donovan, and E. F. Skelton, Surf. Coat. Technol. 86-87, 149 (1996).
-
(1996)
Surf. Coat. Technol.
, vol.86-87
, pp. 149
-
-
Qadri, S.B.1
Horwitz, J.S.2
Christey, D.B.3
Donovan, E.P.4
Skelton, E.F.5
-
23
-
-
28044451190
-
-
P. F. Carcia, R. H. French, K. Sharp, J. S. Meth, and B. W. Smith, Proc. SPIE 2884, 255 (1996).
-
(1996)
Proc. SPIE
, vol.2884
, pp. 255
-
-
Carcia, P.F.1
French, R.H.2
Sharp, K.3
Meth, J.S.4
Smith, B.W.5
-
24
-
-
2142780806
-
-
Perkin - Elmer, Eden Prairie, MN
-
C. D. Wangner, W. M. Riggs, L. E. Davis, J. F. Moulder, and G. E. Muilenberg, Handbook of X-Ray Photoelectron Spectroscopy (Perkin - Elmer, Eden Prairie, MN, 1978).
-
(1978)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Wangner, C.D.1
Riggs, W.M.2
Davis, L.E.3
Moulder, J.F.4
Muilenberg, G.E.5
|