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Volumn 37, Issue 14, 2004, Pages 2009-2017

Reliability tests of gated silicon field emitters for use in space

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRIC PROPULSION; GATES (TRANSISTOR); ION BOMBARDMENT; RELIABILITY; SATELLITES; SCANNING ELECTRON MICROSCOPY; SPACE APPLICATIONS; SPACECRAFT;

EID: 3242663664     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/14/018     Document Type: Article
Times cited : (31)

References (22)
  • 16
    • 0013364316 scopus 로고    scopus 로고
    • Silicon field emitter arrays
    • ed W Zhu (New York: Wiley)
    • Shaw J and Itoh J 2001 Silicon field emitter arrays Vacuum Micro-electronics ed W Zhu (New York: Wiley) pp 187-246
    • (2001) Vacuum Micro-electronics , pp. 187-246
    • Shaw, J.1    Itoh, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.