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Volumn 37, Issue 14, 2004, Pages 2009-2017
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Reliability tests of gated silicon field emitters for use in space
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT DENSITY;
ELECTRIC CURRENTS;
ELECTRIC FIELDS;
ELECTRIC PROPULSION;
GATES (TRANSISTOR);
ION BOMBARDMENT;
RELIABILITY;
SATELLITES;
SCANNING ELECTRON MICROSCOPY;
SPACE APPLICATIONS;
SPACECRAFT;
SATELLITE PROPULSION;
SEMICONDUCTOR FIELD EMITTERS (FE);
SEMICONDUCTING SILICON;
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EID: 3242663664
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/37/14/018 Document Type: Article |
Times cited : (31)
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References (22)
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