Emission stability of a field emitter array observed by an emission microscope

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 1 SPEC., 2003, Pages 436-439

  Miyamoto, Nobuo ^a   Adachi, Hiroshi ^a   Nakane, Hideaki ^a   Yamane, Khoichi ^a  

^a MURORAN INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DESORPTION; ELECTRON EMISSION; ELECTRON MICROSCOPY; GRAPH THEORY; ION BOMBARDMENT; IONIZATION; MATHEMATICAL MODELS; MOLECULES; MOLYBDENUM; NUMERICAL ANALYSIS; TUNGSTEN;

EMISSION MICROSCOPE; EMISSION STABILITY; FIELD EMITTER ARRAY; HIGH-ENERGY ION BOMBARDMENT;

FIELD EMISSION CATHODES;

EID: 0037207742     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1535170     Document Type: Article

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