Modeling of thermal effects in silicon field emitters

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 3, 1996, Pages 1918-1923

  Ancona, M G ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000456434     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588955     Document Type: Article

References (20)

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4. We note that our calculations neglect the Thomson effect, see, e.g., G. N. Fursey and D. Glazanov, J. Vac. Sci. Technol. B 13, 1044 (1995).
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