Synthesis and size differentiation of Ge nanocrystals in amorphous SiO 2

Applied Physics A: Materials Science and Processing

Volumn 83, Issue 1, 2006, Pages 107-110

  Agan S ^a,c   Celik Aktas A ^a   Zuo, J M ^a   Dana, A ^b   Aydinli, A ^b  

^a United States of America   (United States)

^b BILKENT UNIVERSITY   (Turkey)

^c KIRIKKALE UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; GERMANIUM; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICA; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

GERMANOSILICATE LAYERS; SILICON DIOXIDE LAYERS; SILICON SUBSTRATES;

NANOSTRUCTURED MATERIALS;

EID: 32244443321     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-005-3464-1     Document Type: Article

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