Scanning tunneling spectroscopy study of the ZnO(0001)-zn surface

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 45, Issue 1-3, 2006, Pages

  Kishida, Masaru ^a   Murata, Yuya ^a   Maeda, Daisuke ^a   Okado, Hideaki ^a   Honda, Shin Ichi ^a   Oura, Kenjiro ^a   Katayama, Mitsuhiro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

First principles molecular dynamics; Scanning tunneling spectroscopy; Surface electronic structure; Wide band gap semiconductor; Zinc oxide

Indexed keywords

ATOMS; ELECTRONIC STRUCTURE; IMAGING SYSTEMS; MOLECULAR DYNAMICS; SCANNING TUNNELING MICROSCOPY; ZINC OXIDE;

FIRST PRINCIPLES MOLECULAR DYNAMICS; SCANNING TUNNELING SPECTROSCOPY; SURFACE ELECTRONIC STRUCTURE; WIDE BAND GAP SEMICONDUCTORS;

SPECTROSCOPIC ANALYSIS;

EID: 32144445241     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.L39     Document Type: Article

References (22)

1. For example, A. Tsukazaki, M. Kubota, A. Ohtomo, T. Onuma, K. Ohtani, H. Ohno, S. F. Chichibu and M. Kawasaki: Jpn. J. Appl. Phys. 44 (2005) L643.
2. A. Wander, F. Schedin, P. Steadman, A. Norris, R. McGrath, T. S. Turner, G. Thornton and N. M. Harrison: Phys. Rev. Lett. 86 (2001) 3811.
3. M. Joseph, H. Tabata and T. Kawai: Jpn. J. Appl. Phys. 38 (1999) L1205.
4. T. Yamamoto and K. Yoshida: Jpn. J. Appl. Phys. 38 (1999) L166.
5. W. Xu, Z. Ye, T. Zhou, B. Zhao, L. Zhu and J. Huang: J. Cryst. Growth 265 (2004) 133.
6. H. Maki, N. Ichinose, N. Ohashi, H. Haneda and J. Tanaka: Surf. Sci. 457 (2000) 377.
7. N. Jedrecy, M. Sauvage-Simkin and R. Pinchaux: Appl. Surf. Sci. 162-163 (2000) 69.
8. B. Meyer and D. Marx: Phys. Rev. B 67 (2003) 35403.
9. M. Kubo, Y. Oumi, H. Takaba, A. Chatterjee, A. Miyamoto, M. Kawasaki, M. Yoshimoto and H. Koinuma: Phys. Rev. B 61 (2000) 16187.
10. O. Dulab, L. A. Boatner and U. Diebold: Surf. Sci. 519 (2002) 201.
11. O. Dulab, U. Diebold and G. Kresse: Phys. Rev. Lett. 90 (2003) 16102.
12. G. Kresse, O. Dulab and U. Diebold: Phys. Rev. B 68 (2003) 245409.
13. Y. Imai, A. Watanabe and I. Shimono: J. Mater. Sci. Electron. 14 (2003) 149.
14. M. C. Payne, D. C. Allan, T. A. Arias and J. D. Johannopoulus: Rev. Mod. Phys. 64 (1992) 1045.
15. D. Vanderbilt: Phys. Rev. B 41 (1990) 7892.
16. J. A. White and D. M. Bird: Phys. Rev. B 50 (1994) 4954.
17. B. Hammer, L. B. Hansen and J. K. Nørskov: Phys. Rev. B 59 (1999) 7413.
18. A. N. Mariano and R. E. Hanneman: J. Appl. Phys. 34 (1963) 384.
19. S. Fujii, Y. Michishita, N. Miyamae, H. Suto, S. Honda, K. Oura and M. Katayama: Jpn. J. Appl. Phys. 44 (2005) L1285.
20. W. Kamiński and L. Jurczyszyn: Surf. Sci. 566-568 (2004) 29.
21. A. A. Bonapasta, G. Scavia and F. Buda: Surf. Sci. 520 (2002) 53.
22. Q. K. Xue, Q. Z. Xue, S. Kuwano, T. Sakurai, T. Ohno, I. S. T. Tsong, X. G. Qiu and Y. Segawa: Thin Solid Films 367 (2000) 149.