Meta-stability effects in organic based transistors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5940, Issue , 2005, Pages 1-8

  Gomes, H L ^a   Stallinga, P ^a   Murgia, M ^b   Biscarini, F ^b   Muck, T ^c   Wagner, V ^c   Smits, E ^d   De Leeuw, D M ^d  

^a UNIVERSITY OF ALGARVE   (Portugal)

^b CNR   (Italy)

^c JACOBS UNIVERSITY BREMEN   (Germany)

^d PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Gate bias stress; Impedance spectroscopy; Organic transistor; Traps

Indexed keywords

FIELD EFFECT TRANSISTORS; MIS DEVICES; PHASE TRANSITIONS;

ELECTRICAL INSTABILITY; META-STABILITY EFFECTS; ORGANIC-BASED TRANSISTORS;

TRANSISTORS;

EID: 31744443933     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.617862     Document Type: Conference Paper

References (8)

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