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Thin Solid Films

Volumn 500, Issue 1-2, 2006, Pages 169-173

Structural characterisation of ultra-high vacuum sublimated polycrystalline thin films of hexathiophene

(5) Campione, M a Sassella, A a Moret, M a Thierry, A b Lotz, B b

a UNIVERSITY OF MILANO BICOCCA (Italy)

b INSTITUT CHARLES SADRON (France)

Author keywords

Atomic force microscopy (AFM); Electron diffraction; Organic semiconductors; Structural properties

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON DIFFRACTION; OPTOELECTRONIC DEVICES; ORGANIC COMPOUNDS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING ORGANIC COMPOUNDS; SUBLIMATION; ULTRAHIGH VACUUM;

HEXATHIOPHENE; STRUCTURAL PROPERTIES;

THIN FILMS;

EID: 31644440706 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2005.11.032 Document Type: Article

Times cited : (8)

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