-
1
-
-
0029779805
-
-
S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku and Y. Sugiraoto: Jpn. J. Appl. Phys. 35 (1996) L74.
-
(1996)
Jpn. J. Appl. Phys.
, vol.35
-
-
Nakamura, S.1
Senoh, M.2
Nagahama, S.3
Iwasa, N.4
Yamada, T.5
Matsushita, T.6
Kiyoku, H.7
Sugiraoto, Y.8
-
3
-
-
0032668826
-
-
S. T. Sheppard, K. Doverspike, W. L. Pribble, S. T. Allen, J. W. Palmour, L. T. Kehias and T. J. Jenkins: IEEE Electron Device Lett. 20 (1999) 161.
-
(1999)
IEEE Electron Device Lett.
, vol.20
, pp. 161
-
-
Sheppard, S.T.1
Doverspike, K.2
Pribble, W.L.3
Allen, S.T.4
Palmour, J.W.5
Kehias, L.T.6
Jenkins, T.J.7
-
4
-
-
0000616804
-
-
P. Kozodoy, Y. P. Smorchkova, M. Hansen, H. Xing, S. P. DenBaars, U. K. Mishra, A. W. Saxler, P. Perrin and W. C. Mitchel: Appl. Phys. Lett. 75 (1999) 2444.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 2444
-
-
Kozodoy, P.1
Smorchkova, Y.P.2
Hansen, M.3
Xing, H.4
Denbaars, S.P.5
Mishra, U.K.6
Saxler, A.W.7
Perrin, P.8
Mitchel, W.C.9
-
9
-
-
0036509059
-
-
A. Ishida, T. Ose, H. Nagasawa, K. Ishino, Y. Inoue and H. Fujiyasu: Jpn. J. Appl. Phys. 41 (2002) L236.
-
(2002)
Jpn. J. Appl. Phys.
, vol.41
-
-
Ishida, A.1
Ose, T.2
Nagasawa, H.3
Ishino, K.4
Inoue, Y.5
Fujiyasu, H.6
-
13
-
-
0000773862
-
-
C. Gmachl, A. Tredicucci, F. Capasso, A. L. Hutchinson, D. L. Sivco, J. N. Baillargeon and A. Y. Cho: Appl. Phys. Lett. 72 (1998) 3130.
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 3130
-
-
Gmachl, C.1
Tredicucci, A.2
Capasso, F.3
Hutchinson, A.L.4
Sivco, D.L.5
Baillargeon, J.N.6
Cho, A.Y.7
-
14
-
-
0032517715
-
-
C. Sirtori, P. Kruck, S. Barbieri, P. Collot, J. Nagle, M. Beck, J. Faist and U. Oesterle: Appl. Phys. Lett. 73 (1998) 3486.
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 3486
-
-
Sirtori, C.1
Kruck, P.2
Barbieri, S.3
Collot, P.4
Nagle, J.5
Beck, M.6
Faist, J.7
Oesterle, U.8
-
15
-
-
0000448469
-
-
A. Ishida, E. Yaraamoto, K. Ishino, K. Ito, H. Fujiyasu and Y. Nakanishi: Appl. Phys. Lett. 67 (1995) 665.
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 665
-
-
Ishida, A.1
Yaraamoto, E.2
Ishino, K.3
Ito, K.4
Fujiyasu, H.5
Nakanishi, Y.6
-
16
-
-
0033340127
-
-
S. Chu, T. Saisho, K. Fujimura, S. Sakakibara, F. Tanoue, K. Ishino, A. Ishida, H. Harima, Y. Oka, K. Takahiro, Y. Chen, T. Yao and H. Fujiyasu: Jpn. J. Appl. Phys. 38 (1999) 4973.
-
(1999)
Jpn. J. Appl. Phys.
, vol.38
, pp. 4973
-
-
Chu, S.1
Saisho, T.2
Fujimura, K.3
Sakakibara, S.4
Tanoue, F.5
Ishino, K.6
Ishida, A.7
Harima, H.8
Oka, Y.9
Takahiro, K.10
Chen, Y.11
Yao, T.12
Fujiyasu, H.13
-
17
-
-
31544460869
-
-
(IPAP, Tokyo) IPAP Conf. Ser. No. 1
-
A. Ishida, M. Kitano, T. Ose, H. Fujita, K. Ishino, Y. Inoue and H. Fujiyasu: Proc. Im. Workshop on Nitride Semiconductors (IPAP, Tokyo, 2000) IPAP Conf. Ser. No. 1, p. 255.
-
(2000)
Proc. Im. Workshop on Nitride Semiconductors
, pp. 255
-
-
Ishida, A.1
Kitano, M.2
Ose, T.3
Fujita, H.4
Ishino, K.5
Inoue, Y.6
Fujiyasu, H.7
-
18
-
-
7044270839
-
-
Y. Inoue, T. Hoshino, S. Takeda, K. Ishino, A. Ishida, H. Fujiyasu, H. Kominami, H. Miraura, Y. Nakanishi and S. Sakakibara: Appl. Phys. Lett. 85 (2004) 2340.
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 2340
-
-
Inoue, Y.1
Hoshino, T.2
Takeda, S.3
Ishino, K.4
Ishida, A.5
Fujiyasu, H.6
Kominami, H.7
Miraura, H.8
Nakanishi, Y.9
Sakakibara, S.10
-
19
-
-
0036493021
-
-
A. Ishida, M. Kitano, T. Ose, H. Nagasawa, K. Ishino, Y. Inoue, H. Fujiyasu, H. Kan, H. Makino and T. Yao: Physica E 13 (2002) 1098.
-
(2002)
Physica E
, vol.13
, pp. 1098
-
-
Ishida, A.1
Kitano, M.2
Ose, T.3
Nagasawa, H.4
Ishino, K.5
Inoue, Y.6
Fujiyasu, H.7
Kan, H.8
Makino, H.9
Yao, T.10
-
21
-
-
12144286957
-
-
Y. Inoue, H. Nagasawa, N. Sone, K. Ishino, A. Tshida, H. Fujiyasu, J. J. Kim, H. Makino, T. Yao, S. Sakakibara and M. Kuwabara: J. Cryst. Growth 265 (2004) 65.
-
(2004)
J. Cryst. Growth
, vol.265
-
-
Inoue, Y.1
Nagasawa, H.2
Sone, N.3
Ishino, K.4
Tshida, A.5
Fujiyasu, H.6
Kim, J.J.7
Makino, H.8
Yao, T.9
Sakakibara, S.10
Kuwabara, M.11
|