Spectroscopy of a bulk GaN microcavity grown on Si(111)

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 7 A, 2005, Pages 4902-4908

  Ollier, Nadège ^a   Natali, Franck ^b   Byrne, Declan ^b   Disseix, Pierre ^a   Mihailovic, Martine ^a   Vasson, Aimé ^a   Leymarie, Joël ^a   Semond, Fabrice ^b   Massies, Jean ^b  

^a UNIVERSITÉ CLERMONT AUVERGNE   (France)

^b CRHEA CNRS   (France)

Author keywords

Exciton; Microcavity; Nitride; Oscillator strength; Photoluminescence; Polariton; Reflectivity; Strong coupling

Indexed keywords

EXCITONS; MICROGRAVITY PROCESSING; MIRRORS; OSCILLATORS (ELECTRONIC); PHOTOLUMINESCENCE; REFLECTION; SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS;

MICROGRAVITY; POLARITON; STRONG COUPLING;

GALLIUM NITRIDE;

EID: 31544446314     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.4902     Document Type: Article

References (38)

1. T. Someya, K. Tachibana, J. Lee, T. Kamiya and Y. Arakawa: Jpn. J. Appl. Phys. 37 (1998) L1424.
2. Y. K. Song, H. Zhou, M. Diagne, A. V. Nurmikko, R. P. Schneider, C. P. Kuo, M. R. Krames, R. S. Kern, C. Carter-Coman and F. A. Kish: Appl. Phys. Lett. 74 (1999) 3441.
3. I. L. Krestnikov, W. V. Lundin, A. V. Sakharov, V. A. Semenov, A. S. Usikov, A. F. Tsatsulnikov, Zh. T. Alferov, N. N. Ledentsov, A. Hoffmann and D. Bimberg: Appl. Phys. Lett. 75 (1999) 1192.
4. B. Roycroft, M. Akhter, P. Maaskant, P. De Mierry, S. Fernandez, F. B. Naranjo, E. Calleja, T. McCormak and B. Corbett: Phys. Status Solidi A 192 (2002) 97.
5. H. De Neve, J. Blondelle, P. Van Deale, P. Demeester and R. Beats: Appl. Phys. Lett. 70 (1997) 799.
6. A. Shaw, T. Mc Cormack, A. L. Bradley, J. G. Lunney and J. F. Donegan: Phys. Status Solidi A 192 (2002) 103.
7. C. Weisbuch, M. Nishioka, A. Ishikawa and Y. Arakawa: Phys. Rev. Lett. 69 (1992) 3314.
8. V. Savona, L. C. Andreani, P. Schwendimann and A. Quattropani: Solid State Commun. 93 (1995) 733.
9. L. C. Andreani, V. Savona, P. Schwendimann and A. Quattropani: Superlattices Microstruct. 15 (1994) 433.
10. S. Pau, G. Björk, J. Jacobson and H. Cao et Y. Yamamoto: Phys. Rev. B 51 (1995) 14437.
11. S. Jorda: Solid State Commun. 93 (1995) 45.
12. Y. Yamamoto, F. Matinaga, A. Karlsson, J. Jacobson, G. Björk and T. Mukai: J. Phys. IV (Paris) 3 (1993) C5-39.
13. R. Houdre, R. P. Stanley, U. Oersterle, M. Illegems and C. Weisbuch: Phys. Rev. B 49 (1994) 16761.
14. R. Houdre, R. P. Stanley, U. Oesterle, M. Illegems and C. Weisbuch: Phys. Rev. Lett. 73 (1994) 2043.
15. I. Abram, S. lung, R. Kuszelewicz, G. Le Roux, C. Licoppe, J. L. Oudar, E. V. K. Rao, J. Bloch, R. Planel and V. Thierry-Mieg: Appl. Phys. Lett. 65 (1994) 2516.
16. J. Tignon, P. Voisin, C. Delalande, M. Voos, R. Houdre, U. Oesterle and R. P. Stanley: Phys. Rev. Lett. 74 (1995) 3967.
17. T. A. Fischer, A. M. Afshar, D. M. Whittaker, M. S. Skölnick, J. S. Roberts, G. Hill and M. A. Pate: Phys. Rev. B 51 (1995) 2600.
18. P. Kelkar, V. Kozlov, H. Jeon, A. V. Nurmiko, C.-C. Chu, D. C. Grillo, J. Han, C. G. Hua and R. L. Gunshor: Phys. Rev. B 52 (1995) R5491.
19. N. Antoine-Vincent, F. Natali, D. Byrne, A. Vasson, P. Disseix, J. Leymarie, M. Leroux, F. Semond and J. Massies: Phys. Rev. B 68 (2003) 153313.
20. F. Semond, Y. Cordier, N. Grandjean, F. Natali, B. Damilano, S. Vézian and J. Massies: Phys. Status Solidi A 188 (2001) 501.
21. F. Semond, P. Lorenzini, N. Grandjean and J. Massies: Appl. Phys. Lett. 78 (2001) 335.
22. D. Baxter, M. S. Skolnick, A. Armitage, V. N. Astratov, D. M. Whittaker, T. A. Fisher, J. S. Roberts, D. J. Mowbray and M. A. Kaliteevski: Phys. Rev. B 56 (1997) R10032.
23. A. Armitage, T. A. Fisher, M. S. Skolnick, D. M. Whittaker, P. Kinsler and J. S. Roberts: Phys. Rev. B 55 (1997) 16395.
24. R. M. A. Azzam and N. M. Bashara: Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
25. N. Antoine-Vincent, F. Natali, M. Mihailovic, A. Vasson, J. Leymarie, P. Disseix, D. Byrne, F. Semond and J. Massies: J. Appl. Phys. 93 (2003) 5222.
26. N. Antoine-Vincent, F. Natali, M. Mihailovic, P. Disseix, A. Vasson, J. Leymarie, D. Byrne. F. Semond and J. Massies: Phys. Status Solidi A 195 (2003) 543.
27. G. E. Jellison, Jr: Opt. Mater. 1 (1992) 151.
28. K. Kornitzer, T. Ebner, K. Thonke, R. Sauer, C. Kirchner, V. Schwegler, M. Kamp, M. Lesczynski, I. Grzegory and S. Porowski: Phys. Rev. B 60 (1999) 1471. The fit of the reflectivity spectrum of an high-quality homoepitaxial GaN layer demonstrates that the oscillator strength of C exciton is 2 to 4 times lower than the oscillator strengths of B and A respectively.
29. L. Siozade, S. Colard, M. Mihailovic, J. Leymarie, A. Vasson, N. Grandjean, M. Leroux and J. Massies: Jpn. J. Appl. Phys. 39 (2000) 20.
30. J. Bleuse, F. Kany, A. P. de Boer, P. C. M. Christianen, R. Andre and H. Ulmer-Tuffigo: J. Cryst. Growth 184-185 (1998) 750.
31. R. P. Stanley, R. Houdre, C. Weisbuch, U. Oesterle and M. Illegems: Phys. Rev. B 53 (1996) 10995.
32. R. P. Stanley, S. Pau, U. Oesterle, R. Houdre and M. Illegems: Phys. Rev. B 55 (1997) R4867.
33. L. S. Dang, D. Heger, R. Andre, F. Bæuf and R. Romestain: Phys. Rev. Lett. 81 (1998) 3920.
34. C. Pecharroman, J. K. Son, I. W. Tao and E. E. Mendez: Phys. Rev. B 64 (2001) 245331.
35. A. Tredicucci, Y. Chen, V. Pellegrini, M. Börger, L. Sorba, F. Beltram and F. Bassani: Phys. Rev. Lett. 75 (1995) 3906.
36. S. Rudin, T. L. Reinecke and B. Segall: Phys. Rev. B 42 (1990) 11218.
37. D. E. Aspnes: in Optical Properties of Solids, ed. M. Balkanski (North-Holland, Amsterdam, 1980) Chap. 4A.
38. D. E. Aspnes: Phys. Rev. B 10 (1974) 4228.