Oriented growth of ZnO thin films on SiC buffered Si(001) substrates by pulsed laser deposition

Materials Science Forum

Volumn 449-452, Issue I, 2004, Pages 489-492

  Yoo, Chang Jun ^a   Shim, Yeon A ^a   Moon, Jong Ha ^a   Kim, Sang Sub ^a   Lee, Byung Teak ^a   Kim, Jin Hyeok ^a  

^a Chonnam National University   (South Korea)

Author keywords

Interfacial structure; Oriented Growth; PLD; TEM; Thin Films; ZnO

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; HIGH RESOLUTION ELECTRON MICROSCOPY; MICROSTRUCTURE; PARTIAL PRESSURE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; SILICON; SINTERING; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE;

CRYSTALLINITY; INTERFACIAL STRUCTURES; ORIENTED GROWTH; SELECTED AREA DIFFRACTION PATTERN (SADP);

PULSED LASER DEPOSITION;

EID: 3142752128     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.449-452.489     Document Type: Conference Paper

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