A stand-alone integrated test core for time and frequency domain measurements

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 1190-1199

  Hafed, Mohamed ^a   Abaskharoun, Nazmy ^a   Roberts, Gordon W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPARATOR CIRCUITS; DIGITAL SIGNAL PROCESSING; FREQUENCY DOMAIN ANALYSIS; NAND CIRCUITS; SAMPLING; SPECTRUM ANALYSIS; TIME DOMAIN ANALYSIS;

RECONSTRUCTION FILTERS;

INTEGRATED CIRCUIT TESTING;

EID: 0035687605     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

1. Towards a standard for embedded core test: An example
2. On-chip analog signal generation for mixed-signal built-in self-test
3. Oversampling-based analog multitone signal generator
4. Digitizer error extraction in the nonlinearity test
5. High speed and area efficient on-chip analog waveform extractor
6. Early capture for boundary scan timing measurements
7. A robust deep submicron programmable DC voltage generator
8. On-chip sampling in CMOS integrated circuits
9. A semi-digital DLL with unlimited phase shift capability and 0.08-400MHz operating range
10. Testing and characterizing jitter in 100Base-Tx and 155.52 Mbits/s ATM devices with a 1 Gsample/s AWG in an ATE system
11. Microelectromechanical systems (MEMS)