Shot noise in parallel wires

Nanotechnology

Volumn 15, Issue 7, 2004, Pages

  Lagerqvist, Johan ^a   Chen, Yu Chang ^a   Di Ventra, Massimiliano ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRIC CONDUCTORS; ELECTRODES; ELECTRONS; SENSITIVITY ANALYSIS; SHOT NOISE; SIGNAL INTERFERENCE;

ELECTRON TRANSPORT; FANO FACTORS; NANOSCALE CONDUCTORS; PARALLEL WIRES;

ELECTRIC WIRE;

EID: 3142663155     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/7/053     Document Type: Article

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